e/Linnik interferometer

Information
has gloss	eng: A Linnik interferometer is a two-beam interferometer used in microscopy and surface contour measurements or topography. The basic configuration is the same as a Michelson interferometer. What distinguishes the Linnik configuration is the use of measurement optics in the reference arm, which essentially duplicate the objective measurement optics in the measurement arm. The advantage of this design its ability to compensate for chromatic dispersion and other optical aberrations.
lexicalization	eng: Linnik interferometer
instance of	c/Interferometers

Media
media:img	US Patent 7126698 B2.jpg